Reliability of computer memories in radiation environment

The Reliability of Single-Error Protected Computer Memories

+ dl (@be + bcd + bede + ad + ace). Noting that the desired function is to be realized on node 1 of the circuit, the C F of the specification can be obtained [2], [3] as @*= d l f + d l f + DON'T CARE terms = dl (66 + &+ 6@+ 6Cd) + dl (ad+ be+ ace + bcd) + abcde. From [2] and [3],_a circuit realizes its specification iff +* < +S. In other words, @*.a, = 0. That the latter relation is satisfied ...

Advanced Non-Volatile Memories: Reliability and Ionizing Radiation Effects

Reliability Tradeoffs in Design of Cache Memories

Cache memory is a fundamental component of all modern microprocessors. Caches provide for efficient read/write access to memory, and their reliability is essential to assure dependable computing. Errors that occur in the cache can corrupt data values or result in invalid state, and can easily propagate throughout the system to cause data integrity issues. One of the main threats to cache reliab...

Computer Memories: The History Of Computer Form

This paper looks at the computer as a truly global form. The similar beige boxes found in offices across the world are analysed from the perspective of design history rather than that of the history of science and technology. Through the exploration of an archive of computer manufacturer's catalogues and concurrent design texts, this paper examines the changes that have occurred in the producti...

modularity of reading comprehension in multiple-choice cloze procedure and reliability fluctuation

هدف این رساله تحقیق در مورد یافتن ارتباط بین واحدهای درک مطلب (از قبیل پروسه واژگانی، پروسه ساختاری و پروسه تفسیر معنایی) از طریق تست کلوز چهار چوابی در بین دانشجویان سال آخر رشته زبان انگلیسی میباشد. در مرحله اول از 150 دانشجو (80 مونث و 70 مذکر) از بین دانشجویان کارشناسی و کارشناسی ارشد دانشگاههای علامه طباطبائی، دانشگاه شهید بهشتی و دانشگاه آزاد اسلامی واحد شمال تست نلسون (450 دی) گرفته شد. ...